MOSCOW BAUMANN STATE TECHNICAL UNIVERSITY
DEMO VERSION!!!

INTERNET LABORATORY "PLASMA SPECTROMETRY AND PLASMA NANOTECHNOLOGIES"

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EQUIPMENT

   Spectrometer

   Optical behch design

   Optical resolution

   CCD-detector

   Microprocessor board

   Fibre optic cable

   Collimating lens

   Objects of research

   AVALight lamp

   Halogen and deuterium lamps

SPECTROMETER CONTROL PARAMETERS

   Optical channels

   Smoothing

   Integration time

   Average

   Correct for dynamic dark

   Saturation detection levels

TRAININGS

   Technics and practice of spectrofotometry

   The qualitative analysis of radiation spectrum

   Definition of the Electronic Temperature in Plasma

PLASMA NANOTECHNOLOGIES

   Plasma facility for nanotechnologies

   Experiment scheme

   Plasma spatial scanning

   Working gas mixture pressure and composition control

   Control interface
 
Integration time
This option changes the CCD readout frequency and therefore the exposure- or integration time of the CCD detector. The longer the integration time, the more light is exposed to the detector during a single scan, so the higher the signal.

If the integration time is set too long, too much light reaches the detector. The result is that, over some wavelength range, the signal extends the maximum counts (16383) or in extreme case shows as a straight line at any arbitrary height, even near zero. Entering a shorter integration time can usually solve this. Try to adjust the integration time, such that the maximum count over the wavelength range is around 15000 counts.

When at minimum integration the signal is still too high, an attenuator, a neutral density filter or fibers with a smaller diameter may be used. When not enough light reaches the spectrometer, likewise a longer integration time should be entered.